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The page that decides the fate of a grad student ...
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Goyal, S.; Choudhury,
M.; Rao, S.S.S.P.; Kalyan Kumar, L, ``Multiple Fault testing of Logic
Resources of SRAM-Based FPGAs", 18th International
Conference on VLSI Design, 4th International Conference on
Embedded Systems, Page(s): 742 – 747, Jan.3-7, 2005, Kolkatta,
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and K. Mohanram, ``Design optimization for robustness to soft
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